Nanoscale 3D Imaging For Semiconductor & Advanced Materials Research

Product Description:

The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM). Additionally, it offers an optional Conductive Atomic Force Microscopy (C-AFM) mode, allowing users to expand its capabilities for electrical property measurements. The combination of these modes makes the AFM an indispensable tool for researchers and engineers working in materials science, nanotechnology, and semiconductor industries.

One of the standout features of this AFM is its comprehensive scanning range, which covers 100 μm * 100 μm in the lateral directions and 10 μm in the vertical direction. This extensive range enables detailed analysis of a wide variety of sample types and sizes, providing flexibility and precision in imaging and measurement. The instrument is compatible with samples up to 25 mm in diameter, accommodating a broad spectrum of specimen dimensions without the need for special mounting or preparation, thus enhancing user convenience and throughput.

The scanning capabilities of this AFM are further enhanced by its XYZ three-axis full-sample scanning method. This advanced scanning approach allows for complete and accurate mapping of sample surfaces, providing rich topographical and functional information at the nanoscale. The three-axis control ensures that every part of the sample can be examined with high precision, making it ideal for detailed surface morphology studies and complex material characterizations.

In terms of operational speed, the AFM supports a scanning rate range from 0.1 Hz to 30 Hz. This broad range allows users to tailor the scanning speed according to the specific requirements of their experiments, balancing resolution and time efficiency. Whether conducting slow, high-resolution imaging or faster scans for preliminary assessments, the AFM adapts seamlessly to different research needs.

Another key advantage of this Atomic Force Microscope is its ability to perform non-contact scanning. The non-contact mode is essential for analyzing delicate or soft samples, where physical contact could alter or damage the surface. By minimizing sample disturbance while maintaining high-resolution imaging, the AFM ensures reliable and reproducible results. This feature makes it well-suited for applications in biology, polymers, and other sensitive materials.

As a Scanning Probe Microscope (SPM), this AFM excels in delivering multiple modes of surface and property analysis within a single platform. The integration of various force microscopy techniques allows users to investigate electrical, mechanical, magnetic, and piezoelectric properties without switching instruments. This multifunctionality reduces experimental complexity and saves valuable laboratory space and resources.

In summary, the Atomic Force Microscope offers a powerful combination of multiple modes, extensive scanning range, flexible sample compatibility, and high scanning rates, all incorporated within a state-of-the-art XYZ three-axis scanning system. Its non-contact imaging capability and SPM technology make it an essential tool for cutting-edge research and industrial applications where nanoscale precision and multifunctional measurements are critical. Whether for academic research or industrial quality control, this AFM stands out as a reliable and adaptable solution for comprehensive surface characterization.

Features:

• Product Name: Atomic Force Microscope
• Scanning Method: XYZ Three-Axis Full-Sample Scanning
• Sample Size: Compatible With Samples With A Diameter Of 25 Mm
• Scanning Rate: 0.1 Hz - 30 Hz
• Z-Axis Noise Level: 0.04 Nm
• Multifunctional Measurements: Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), Scanning Capacitive Atomic Force Microscope (SCM), Magnetic Force Microscope (MFM); Optional: Conductive Atomic Force Microscope (C-AFM)
• Supports Multi-Mode Measurement for versatile applications
• Enables high-resolution Nanoscale Analysis
• Provides detailed Topography imaging for surface characterization

Technical Parameters:

This Atomic Force Microscope is ideal for Surface Analysis and Nanomechanical testing, offering advanced capabilities including Magnetic Force Microscopy for comprehensive material characterization.

Applications:

The Truth Instruments AtomEdge Pro Atomic Force Microscope, originating from China, is a cutting-edge tool designed for a wide range of scientific and industrial applications. Its multifunctional measurement capabilities, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM), make it an indispensable instrument for detailed surface characterization. Additionally, the optional Conductive Atomic Force Microscope (C-AFM) expands its utility to electrical property investigations, providing a comprehensive platform for nanoscale analysis.

The AtomEdge Pro supports various operating modes such as Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-Directional Scanning Mode, allowing users to tailor measurements according to specific sample requirements. This versatility is particularly beneficial in research environments where delicate samples demand non-destructive imaging techniques or where different contrast mechanisms are needed to extract valuable data. With image sampling points ranging from 32*32 to an impressive 4096*4096, the system delivers high-resolution images that enable atomic resolution imaging, crucial for identifying surface features at the atomic scale.

One of the standout applications of the AtomEdge Pro is in Piezoresponse Force Microscopy (PFM), where it excels in mapping the piezoelectric and ferroelectric properties of materials. This capability is vital in materials science and nanotechnology research for developing advanced sensors, actuators, and energy harvesting devices. The low Z-axis noise level of 0.04 nm ensures exceptional sensitivity and accuracy in detecting minute surface deformations related to piezoresponse, thereby enhancing the reliability of experimental results.

The 0 to 360° scanning angle range offers comprehensive spatial coverage, making the AtomEdge Pro suitable for complex surface topographies and anisotropic materials. Its precision and multifunctionality make it ideal for applications in semiconductor research, biomaterials, polymers, and magnetic materials. Whether it is investigating surface potential variations with KPFM or characterizing magnetic domains with MFM, the AtomEdge Pro provides detailed insights that are essential for both fundamental research and industrial quality control.

In summary, the Truth Instruments AtomEdge Pro Atomic Force Microscope is a versatile and highly precise instrument designed for advanced nanoscale surface analysis. Its multifunctional measurement modes, exceptional image resolution, and low noise performance make it an essential tool for researchers and engineers aiming to explore material properties with atomic resolution and to conduct sophisticated Piezoresponse Force Microscopy studies under various application scenarios.