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Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Categories Atomic Force Microscope
Brand Name: Truth Instruments
Model Number: AtomEdge Pro
Place of Origin: CHINA
MOQ: 1
Price: Price Negotiable | Contact us for a detailed quote
Payment Terms: T/T
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Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Product Introduction

The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact, tapping, and non-contact, it offers users greater flexibility and precision in operation. Additionally, it integrates various techniques such as Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Kelvin Microscopy, and Piezoelectric Force Microscopy, delivering robust stability and excellent expandability. Furthermore, functional modules can be flexibly customized to meet specific user requirements, delivering tailored solutions to particular research fields and creating a highly efficient, multi-purpose inspection platform.

Equipment Performance
ItemSpecification
Sample SizeCompatible with samples with a diameter of 25 mm
Scanning MethodXYZ Three-Axis Full-Sample Scanning
Scanning Range100 μm × 100 μm × 10 μm
Scanning Rate0.1 Hz - 30 Hz
Z-Axis Noise Level0.04 nm
NonlinearityXY Direction: 0.02%; Z Direction: 0.08%
Image Sampling Points32×32 - 4096×4096
Operating ModeContact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, Multi-Directional Scanning Mode
Multifunctional Measurements

Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Scanning Capacitive Atomic Force Microscope (SCM), Magnetic Force Microscope (MFM); Optional: Conductive Atomic Force Microscope (C-AFM)

Applications

Strontium titanate(STO) Tap mode

Maze Domain and Skyrmions in MTJ Stack:SAF/MgO/Ta/Co/Pt)₉ Magnetic Force Microscope(MFM)

Bismuth vanadate thin filmScanning Kelvin Microscope(KPFM)

Perovskite (FAPbI₃) Conductive Atomic ForceMicroscope (C-AFM)

Quality Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization for sale
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