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Low Noise Z Axis Atomic Force Microscope

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low noise z axis atomic force microscope

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Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes

... accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm,...

Truth Instruments Co., Ltd.

Address: 169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China

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