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Atomic Force Microscope For Semiconductor Research

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atomic force microscope for semiconductor research

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0.04nm Atomic Force Microscope 0.1Hz - 30Hz AFM Microscope For Precise Nanoscale Surface Analysis

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers......

Truth Instruments Co., Ltd.

Address: 169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China

Opto Edu A62.4503 Atomic Force Microscope with 50μm Scan Range 0.2nm Resolution and 0.6Hz~4.34Hz Scan Rate for Laboratory Research

Basic Level, Separate Controller & Main Body Design, With Contact Mode, Tapping Mode Contact Mode, Tapping Mode, Scan Range XY 50x50um, Z 5um, Scan Resolution XY 0.2nm, Z 0.05nm Sample Size Dia.<90mm, H<20mm, Stage Moving 25x25mm, Optical Objective APO 10x......

Opto-Edu (Beijing) Co., Ltd.

Address: F-1501 Wanda Plaza, No. 18 Shijingshan Road, Beijing 100043, China

JMZ-TK1-7A Vibration Isolator with 4 inches Diameter for High-Frequency and Ultra-Low Frequency Vibration Control

... the upper limit of new discoveries. Equipment such as scanning electron microscopes (SEM), atomic force microscopes (AFM), lithography machines, and gravitational wave detection devices are sensitive to environmental vibrations at the nanometer or...

Xi'an Hoan Microwave Co., Ltd.

Address: F7, Building 2, Xinkai Industrial Park, Jinye 2nd Road, High-tech Zone, Xi'an

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